• Chetan Arvind Patil
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  • NLOG-269 | Semiconductor And Beyond Newsletter | The Semiconductor Test And Reliability

NLOG-269 | Semiconductor And Beyond Newsletter | The Semiconductor Test And Reliability

The Semiconductor Test And Reliability

Semiconductors may be measured in nanometers, wafer yields, or transistor counts, but their true reliability is proven only through testing.

No matter how flawless the design or how advanced the fab, manufacturing variability and hidden defects are inevitable.

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