In the complex world of semiconductor manufacturing, maintaining a high yield - the percentage of functional devices from a batch of wafers - is the ultimate goal. However, various challenges, including wafer excursions, can impede this process.
These wafer-level deviations from the standard processing environment often impact yield by introducing defects that affect the final product's performance and reliability. Thus, in addition to several yield-related learnings, it is also crucial to understand wafer excursions and how they correlate to introducing new semiconductor products.
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